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Transformer on-Load Switch Tester
Measurement accuracyTransition resistance: (±5%+3 words)Transition time:±(0.1%+1word)Storage ModeU-disk Storage, Local Storage 1GShape size350mm×230mm×200mmMain engine weight5kgConditions of UseAmbient temperature-10ºC~50ºCEnvironmental Humidity≤85%RHOperating
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Factory Manufactured LGA52 Electric Test Connector for PCB Board Testing
We provide products with good quality and fast response, also provide customized service. If you like to learn more about us, please have alook at our website:siredatech.en.made-in-china.com.
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California Bearing Ratio 50kn Loading Frame Press Cbr Tester
Basic Info. Model NO. CBR-50
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Newly Design 120A Output Secondary Current Injection Test Set 3 Phase Protection Relay Tester
ItemsSpecificationsAlternating Current(AC) output1Output accuracy0.5magnitude2Phase current output (effective value)0~40A3Three parallel phase current output (effective value)0~120A4Phase current value with long time under permission (effective value)10A5Phase current maximum power output420VA6Three
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Dielectric Loss Tester for Insulating Oil
70mm(D)×120mm(H)Common problem1. Is your company asales company or amanufacturer?Wuhan Huatian Electric Power Automation CO., LTD.is an industrial and trade enterprise, with its ownfactory, self-produced and self-sold.We were founded in 2004 and have fifteen years of production experience. Our
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Digital Partial Discharge Integrated Analyzer
General instructionsCPUFaster 1.60 GHz.Memory2.0 GBHard disk128GB SOLID state driveSystemWindows XpWork environmentAmbient temperature: -10 ~ 45 ° C Relative humidity: ≤95%SizeL*W*H:474mm*288mm*370mmWeight15.8kgProduct pictureDevice displayAbout GDZX Wuhan GDZX Power Equipment Co.,Ltd.is a m
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Breakdown Voltage Test Equipment Made in China
Basic Info. Model NO. BDV T
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DC System Insulation Monitoring and Detecting Apparatus
ZX-JXPDF DC grounding positioning alarm device is a technological innovation and improvement based on the original products. The measurement accuracy and anti capacitance interference ability of the device are improved. The adaptability of performance indicators, the convenience of debugging and t